The IMR atom probe

K. Hono, T. Hashizume, T. Sakurai

    Research output: Contribution to journalArticlepeer-review

    36 Citations (Scopus)

    Abstract

    We have constructed a focusing type time-of-light atom-probe field-ion microscope (APFIM). This atom probe has unique features of (1) low-temperature sample cooling capability (18 K) which allows stable He ion image observations of even aluminum alloys and (2) switchable detector system with a channeltron electron multiplier and channelplate electron multiplier, in addition to the standard features as a modern APFIM. This paper describes the details of the IMR atom probe.

    Original languageEnglish
    Pages (from-to)506-512
    Number of pages7
    JournalSurface Science
    Volume266
    Issue number1-3
    DOIs
    Publication statusPublished - 1992 Apr 15

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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