The formation of nanometer-scale gaps by electrical degradation and their application to C60 transport measurements

K. Tsukagoshi, E. Watanabe, I. Yagi, Y. Aoyagi

Research output: Contribution to journalConference article

15 Citations (Scopus)

Abstract

Nanometer-scale electrodes with a nanogap allow us to investigate electrical transport in nanoparticles. Because many nanomaterials usually form grain boundaries or domain boundaries with high tunneling resistance, it is difficult to investigate nanoparticle properties through a series of tunneling resistances. To make direct contact with the single nanoparticle, we developed a metallic electrode structure and demonstrated direct fullerene C60 nanocrystal transport.

Original languageEnglish
Pages (from-to)686-688
Number of pages3
JournalMicroelectronic Engineering
Volume73-74
DOIs
Publication statusPublished - 2004 Jun
EventMicro and Nano Engineering 2003 - Cambridge, United Kingdom
Duration: 2003 Sep 222003 Sep 25

Keywords

  • C nanocrystal
  • Electric degradation
  • Fullerene
  • Nanogap
  • Nanomaterial transport

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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