We studied the electrical resistance and crystal structure of epitaxial chromium (Cr) films. The lattice constant of the Cr films is larger than that of the bulk Cr because the sample and the substrate MgO have different lattice constants. An chromium oxide layer having a thickness of 1 nm was found on all films from the result of X-ray reflectivity measurements. Although there is sample dependence in electric resistance of Cr films, it is remarkable that a zero resistance was observed for one film of 50 nm thick. TC is obtained to be 3.2 K, which is about twice the previous reports. The large upper critical field is obtained to be HC2 = 13 kOe, and it suggests that Cr may belongs to a type II superconductor.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 2017 Jul 26|
|Event||29th International Symposium on Superconductivity, ISS 2016 - Tokyo, Japan|
Duration: 2016 Dec 13 → 2016 Dec 15
ASJC Scopus subject areas
- Physics and Astronomy(all)