The effects of head configuration on write resolution for submicron track recording

Yoichiro Tanaka; Tomoko Komai Taguchi

doi:10.1109/20.490092

The effects of head configuration on write resolution for submicron track recording

Yoichiro Tanaka, Tomoko Komai Taguchi

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

This paper presents a study of track edge writing phenomena with a view to achieving submicron track width longitudinal recording. Side written bands made by 1 µm wide high Bs FeTaN heads were compared with those by conventional NiFe thin film heads with the same width. Off-track overwrite experiments revealed that the balanced condition of the narrowed write gap and strong head fields by high Bs poles suppressed the width of the degraded side written band and excessive erase band forming near the track edges. An analytical write modeling considering the non-saturation side writing process also showed that optimized narrow write gap along with strong head fields improved the write resolution throughout the narrow track.

Original language	English
Pages (from-to)	2684-2686
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	31
Issue number	6
DOIs	https://doi.org/10.1109/20.490092
Publication status	Published - 1995 Nov
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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abstract = "This paper presents a study of track edge writing phenomena with a view to achieving submicron track width longitudinal recording. Side written bands made by 1 µm wide high Bs FeTaN heads were compared with those by conventional NiFe thin film heads with the same width. Off-track overwrite experiments revealed that the balanced condition of the narrowed write gap and strong head fields by high Bs poles suppressed the width of the degraded side written band and excessive erase band forming near the track edges. An analytical write modeling considering the non-saturation side writing process also showed that optimized narrow write gap along with strong head fields improved the write resolution throughout the narrow track.",

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AB - This paper presents a study of track edge writing phenomena with a view to achieving submicron track width longitudinal recording. Side written bands made by 1 µm wide high Bs FeTaN heads were compared with those by conventional NiFe thin film heads with the same width. Off-track overwrite experiments revealed that the balanced condition of the narrowed write gap and strong head fields by high Bs poles suppressed the width of the degraded side written band and excessive erase band forming near the track edges. An analytical write modeling considering the non-saturation side writing process also showed that optimized narrow write gap along with strong head fields improved the write resolution throughout the narrow track.

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The effects of head configuration on write resolution for submicron track recording

Abstract

ASJC Scopus subject areas

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