The effect of ti underlayer on magnetic properties of CO-CR th in films

O. Kitakami; K. Ojima; Y. Ogawa; T. Maro; H. Fujiwara

doi:10.1109/TMAG.1987.1065375

The effect of ti underlayer on magnetic properties of CO-CR th in films

O. Kitakami, K. Ojima, Y. Ogawa, T. Maro, H. Fujiwara

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

The effect of a Ti underlayer on CO-CR thin film was investigated from the crystallographic and morphological points of view. The CO-CR film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic proper-ties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.

Original language	English
Pages (from-to)	2797-2799
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	23
Issue number	5
DOIs	https://doi.org/10.1109/TMAG.1987.1065375
Publication status	Published - 1987 Sep
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/TMAG.1987.1065375

Fingerprint Dive into the research topics of 'The effect of ti underlayer on magnetic properties of CO-CR th in films'. Together they form a unique fingerprint.

Cite this

@article{1ed4ebfbc0d54d4ebbf0c36afb8bf523,

title = "The effect of ti underlayer on magnetic properties of CO-CR th in films",

abstract = "The effect of a Ti underlayer on CO-CR thin film was investigated from the crystallographic and morphological points of view. The CO-CR film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic proper-ties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.",

author = "O. Kitakami and K. Ojima and Y. Ogawa and T. Maro and H. Fujiwara",

year = "1987",

month = sep,

doi = "10.1109/TMAG.1987.1065375",

language = "English",

volume = "23",

pages = "2797--2799",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - The effect of ti underlayer on magnetic properties of CO-CR th in films

AU - Kitakami, O.

AU - Ojima, K.

AU - Ogawa, Y.

AU - Maro, T.

AU - Fujiwara, H.

PY - 1987/9

Y1 - 1987/9

N2 - The effect of a Ti underlayer on CO-CR thin film was investigated from the crystallographic and morphological points of view. The CO-CR film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic proper-ties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.

AB - The effect of a Ti underlayer on CO-CR thin film was investigated from the crystallographic and morphological points of view. The CO-CR film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic proper-ties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.

UR - http://www.scopus.com/inward/record.url?scp=0023417295&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023417295&partnerID=8YFLogxK

U2 - 10.1109/TMAG.1987.1065375

DO - 10.1109/TMAG.1987.1065375

M3 - Article

AN - SCOPUS:0023417295

VL - 23

SP - 2797

EP - 2799

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 5

ER -