The effect of a Ti underlayer on CO-CR thin film was investigated from the crystallographic and morphological points of view. The CO-CR film on a Ti underlayer has a larger perpendicular magnetic anisotropy and coercive force than that deposited directly on a polyimide film substrate. It is found that the improvement of perpendicular magnetic proper-ties by the insertion of a Ti underlayer is not due to the improvement of the crystallographic c-axis orientation, but is due to the formation of a uniform columnar structure.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering