Abstract
The effect of grain boundary characteristics on the crystal/melt interface morphology during the unidirectional solidification of multicrystalline Si was studied by in situ observations. It was shown that sharp and smooth grooves were formed at the crystal/melt interfaces at Σ27 and random grain boundaries, whereas no grooves were formed at Σ3 {1 1 1} twin boundaries. We explain the reasons why the grooves form at grain boundaries and discuss the impurity segregation at the grain boundary grooves on the crystal/melt interface.
| Original language | English |
|---|---|
| Pages (from-to) | 266-269 |
| Number of pages | 4 |
| Journal | Scripta Materialia |
| Volume | 69 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2013 Aug 1 |
Keywords
- Crystal/melt interface
- Grain boundary character
- Impurity Segregation
- Solidification
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
Fingerprint Dive into the research topics of 'The effect of grain boundary characteristics on the morphology of the crystal/melt interface of multicrystalline silicon'. Together they form a unique fingerprint.
Cite this
Fujiwara, K., Ishii, M., Maeda, K., Koizumi, H., Nozawa, J., & Uda, S. (2013). The effect of grain boundary characteristics on the morphology of the crystal/melt interface of multicrystalline silicon. Scripta Materialia, 69(3), 266-269. https://doi.org/10.1016/j.scriptamat.2013.04.015