The damage depth profile effect on hydrogen isotope retention behavior in heavy ion irradiated tungsten

Hiroe Fujita, Yuki Uemura, Shodai Sakurada, Keisuke Azuma, Qilai Zhou, Takeshi Toyama, Naoaki Yoshida, Yuji Hatano, Takumi Chikada, Yasuhisa Oya

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

To evaluate the damage depth profile effect on hydrogen isotope retention in tungsten (W), combination usage of 0.8 MeV and 6.0 MeV Fe ions were implanted into W with the damage concentrations between 0.03 and 0.1 dpa. Thereafter, 1.0 keV deuterium ion (D2+) implantation was performed with the flux of 1.0 × 1018 D+ m−2 s−1 up to the fluence of 1.0 × 1022 D+ m−2, and the D retention behavior was evaluated by thermal desorption spectroscopy (TDS). The experimental results indicated that 6.0 MeV Fe ion irradiation would introduce vacancies and voids into bulk that were clearly controlled by the damage concentration, and the voids would become the most stable D trapping sites. It was found that D de-trapping from irradiation defects at lower temperature would be enhanced by the accumulation of defect near the surface due to 0.8 MeV Fe ion irradiation.

Original languageEnglish
Pages (from-to)468-472
Number of pages5
JournalFusion Engineering and Design
Volume125
DOIs
Publication statusPublished - 2017 Dec

Keywords

  • Heavy ion irradiation
  • Hydrogen isotope retention behavior
  • Plasma facing materials
  • Tungsten

ASJC Scopus subject areas

  • Civil and Structural Engineering
  • Nuclear Energy and Engineering
  • Materials Science(all)
  • Mechanical Engineering

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