The Charge-Pumping Technique for Grain Boundary Trap Evaluation in Poly silicon TFT’s

Mitsumasa Koyanagi, Yoshihiro Baba, Kiyomi Hata, I. Wei Wu, Alan G. Lewis, Richard Bruce, Mario Fuse

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science