The behavior of pinned layers using a high-field transfer curve

Sangmun Oh, K. Nishioka, H. Umezaki, H. Tanaka, T. Seki, S. Sasaki, T. Ohtsu, K. Kataoka, K. Furusawa

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

In order to study the magnetic behaviors of pinned layers under different conditions, we applied compressive mechanical stress to a device and measured the transfer curve changes using a high-field (10 kOe) quasi-static tester. This permitted us to determine the behaviors of the pinned layers and the free layer. The results of the transfer curve measurements led to a classification of these curves. The governing conditions for each category were also determined. A normal transfer curve occurs when "Ej > Eu ≫ Ek(AP1) and Ek(AP2)," where: AP1 is the pinned layer adjacent to the antiferromagnetic (AFM) layer; AP2 is the pinned layer adjacent to the spacer; Eu is the coupling energy constant between the antiferromagnetic layer and the AP1; Ej is the anti-parallel coupling energy constant between AP1 and AP2 through the Ru; and Ek (API) and Ek(AP2) are the induced uniaxial anisotropic energy constants in AP1 and AP2 due to magnetostriction resulting from stress applied giant magnetoresistive (GMR) sensor.

Original languageEnglish
Pages (from-to)2950-2952
Number of pages3
JournalIEEE Transactions on Magnetics
Volume41
Issue number10
DOIs
Publication statusPublished - 2005 Oct 1
Externally publishedYes

Keywords

  • Anisotropic energy
  • Antiferromagnet
  • Giant magnetoresistive (GMR)
  • High-field transfer curve
  • Pinned layers
  • Quasistatic tester

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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