The application of the analysis of potential driven particle diffusion to the strength of materials

A. Toshimitsu Yokobori, Toshihito Ohmi, Tsutomu Murakawa, Takenao Nemoto, Tomoharu Uesugi, Ryuji Sugiura

    Research output: Contribution to journalArticlepeer-review

    13 Citations (Scopus)

    Abstract

    The problems of diffusion in solid are widely treated as those of numerical analyses such as mechanisms of hydrogen diffusion which causes embrittlement, boundary micro crack initiation and growth under high temperature creep condition and stress and electro-migration due to vacancy diffusion in LSI circuit. In this paper, the significance of α multiplication method which we proposed to analyze the particle diffusion problems under potential gradient and the results obtained from this method were discussed for the problems of hydrogen embrittlement, vacancy diffusion which results in creep crack damage and deformation, and line failure in LSI circuit. Furthermore, temperature characteristic of the sensitivity of particle diffusion and concentration such as hydrogen and vacancy were discussed based on this proposed analysis.

    Original languageEnglish
    Pages (from-to)215-233
    Number of pages19
    JournalStrength, Fracture and Complexity
    Volume7
    Issue number2
    DOIs
    Publication statusPublished - 2011

    Keywords

    • LSI
    • creep damage
    • hydrogen diffusion analysis
    • hydrogen embrittlement
    • vacancy diffusion
    • α multiplication method

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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