Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

V. A. Chernenko, S. Doyle, M. Kohl, P. Müllner, S. Besseghini, M. Ohtsuka

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Texture measurements of two series of Ni-Mn-Ga thin films, sputter-deposited on Mo foils, are performed as a function of both film and substrate thickness. X-ray diffraction experiments were carried out at the SR source ANKA in Germany. In contrast to 1μm-thick films showing 220-fibre texture, both in-plane and out-of-plane texture components are found in submicron films which correlates with the enhanced magnetostrain effect in these films.

Original languageEnglish
Pages (from-to)229-234
Number of pages6
JournalZeitschrift fur Kristallographie, Supplement
Volume2
Issue number26
DOIs
Publication statusPublished - 2007 Jan 1

Keywords

  • Ni-Mn-Ga/Mo thin film composites
  • Texture
  • X-ray synchrotron diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Inorganic Chemistry

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