Abstract
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.
Original language | English |
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Pages (from-to) | 62-68 |
Number of pages | 7 |
Journal | Proceedings of The International Symposium on Multiple-Valued Logic |
Publication status | Published - 2005 Sep 20 |
Event | 35th International Symposium on Multiple-Valued Logic, ISMVL 2005 - Calgary, Alta., Canada Duration: 2005 May 19 → 2005 May 21 |
ASJC Scopus subject areas
- Computer Science(all)
- Mathematics(all)