Temperature-gradient and composition-spread deposition of epitaxial oxide films and high throughput characterization

T. Fukumura, M. Ohtani, J. Nishimura, T. Kageyama, T. Koida, M. Lippmaa, M. Kawasaki, T. Hasegawa, H. Koinuma

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We have developed a laser molecular beam epitaxy system capable of the temperature-gradient and/or composition-spread integration of thin films in a substrate. The latter is achieved by using a moving mask system synchronizing with target exchange and laser pulse. The former employs a substrate holder having a controlled asymmetric thermal conduction heated by a focused Nd:YAG continuous wave laser beam. A concurrent x-ray diffractometer can immediately characterize the dependences of the lattice constant and crystalline quality on the film growth temperature and composition. The temperature-gradient method is very useful for revealing an optimum substrate temperature for epitaxial thin film growth. Several other characterization techniques such as magnetic field microscope and parallel transport measurement system developed for characterizing composition-spread thin films are presented.

Original languageEnglish
Pages (from-to)17-26
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4281
DOIs
Publication statusPublished - 2001 Jan 1
Externally publishedYes

Keywords

  • Combinatorial laser MBE
  • Combinatorial materials science
  • Composition-spread
  • Concurrent XRD
  • Epitaxial thin film
  • Oxide film
  • Scanning SQUID microscope
  • Temperature-gradient

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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