Temperature dependence of electrical resistivity of Co/Cu multilayers at static magnetic field

K. Suenaga, G. Oomi, Y. Uwatoko, T. Sakai, K. Saito, K. Takanashi, H. Fujimori

Research output: Contribution to journalConference articlepeer-review

Abstract

Temperature dependence of the electrical resistivity has been measured below 50 K for the sputtered magnetic multilayers [Co(1.02 nm)/Cu(t Cunm)]25 with different Cu thickness at various magnetic fields. It is found that the electrical resistivities of ferromagnetic (FM) multilayer (tCu = 0.76 nm) and the antiferromagnetic (AFM) one (tCu = 1.05 nm) show temperature dependence of T3/2 and T2, respectively. The slope, A′, of each power law has a maximum near Hs. The results imply that the magnetic fluctuation is a maximum near Hs showing quantum phase transition.

Original languageEnglish
Pages (from-to)1231-1232
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
DOIs
Publication statusPublished - 2004 May
EventProceedings of the International Conference on Magnetism - Rome, Italy
Duration: 2003 Jul 272003 Aug 1

Keywords

  • Multilayers and superlattice
  • Resistivity
  • Temperature dependence

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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