Abstract
Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.
Original language | English |
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Pages (from-to) | 27-34 |
Number of pages | 8 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 803 |
Publication status | Published - 2003 Dec 1 |
Event | Advanced data Storage Materials and Characterization Techniques - Boston, MA, United States Duration: 2003 Dec 1 → 2004 Dec 4 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials