Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.
|Number of pages||8|
|Journal||Materials Research Society Symposium - Proceedings|
|Publication status||Published - 2003 Dec 1|
|Event||Advanced data Storage Materials and Characterization Techniques - Boston, MA, United States|
Duration: 2003 Dec 1 → 2004 Dec 4
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials