Temperature controlled scanning nonlinear dielectric microscopy

K. Ohara; Yasuo Cho

Temperature controlled scanning nonlinear dielectric microscopy

K. Ohara, Yasuo Cho

Information Devices Division

Research output: Contribution to journal › Conference article › peer-review

Abstract

Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10^-7 Torr), and its application to measure the surface polarization state on LiTaO₃ single crystal.

Original language	English
Pages (from-to)	27-34
Number of pages	8
Journal	Materials Research Society Symposium - Proceedings
Volume	803
Publication status	Published - 2003 Dec 1
Event	Advanced data Storage Materials and Characterization Techniques - Boston, MA, United States Duration: 2003 Dec 1 → 2004 Dec 4

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Cite this

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title = "Temperature controlled scanning nonlinear dielectric microscopy",

abstract = "Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.",

author = "K. Ohara and Yasuo Cho",

year = "2003",

month = dec,

day = "1",

language = "English",

volume = "803",

pages = "27--34",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Advanced data Storage Materials and Characterization Techniques ; Conference date: 01-12-2003 Through 04-12-2004",

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TY - JOUR

T1 - Temperature controlled scanning nonlinear dielectric microscopy

AU - Ohara, K.

AU - Cho, Yasuo

PY - 2003/12/1

Y1 - 2003/12/1

N2 - Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.

AB - Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.

UR - http://www.scopus.com/inward/record.url?scp=2942674680&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=2942674680&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:2942674680

VL - 803

SP - 27

EP - 34

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

SN - 0272-9172

T2 - Advanced data Storage Materials and Characterization Techniques

Y2 - 1 December 2003 through 4 December 2004

ER -

Temperature controlled scanning nonlinear dielectric microscopy

Abstract

ASJC Scopus subject areas

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