Temperature Characteristics of Resonance Frequency for Double-Layered Thickness-Shear Resonator

Yuji Ohashi; Yusuke Owada; Yuui Yokota; Akira Yoshikawa; Shunsuke Kurosawa; Kei Kamada; Hiroki Sato; Satoshi Toyoda; Akihiro Yamaji; Masao Yoshino; Takashi Hanada

doi:10.1109/TUFFC.2021.3121782

Temperature Characteristics of Resonance Frequency for Double-Layered Thickness-Shear Resonator

Yuji Ohashi, Yusuke Owada, Yuui Yokota, Akira Yoshikawa, Shunsuke Kurosawa, Kei Kamada, Hiroki Sato, Satoshi Toyoda, Akihiro Yamaji, Masao Yoshino, Takashi Hanada

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The effect of the difference in the thickness ratio of the double-layered thickness-shear resonator on the temperature characteristics of the resonance frequency was investigated using a Ca₃TaGa₃Si₂O₁₄ (CTGS) single crystal. Three specimens with thickness ratios of <inline-formula> <tex-math notation="LaTeX">${x} =0.25$ </tex-math></inline-formula>, 0.33, and 0.50 were prepared using <inline-formula> <tex-math notation="LaTeX">$122^{\circ } ~{Y}$ </tex-math></inline-formula>- and <inline-formula> <tex-math notation="LaTeX">$171^{\circ }~{Y}$ </tex-math></inline-formula>-cut CTGS substrates. For the specimens with <inline-formula> <tex-math notation="LaTeX">${x} =0.25$ </tex-math></inline-formula> and 0.33, the temperature characteristics varied depending on the order of the resonance mode. For the specimen with <inline-formula> <tex-math notation="LaTeX">${x} =0.50$ </tex-math></inline-formula>, on the other hand, almost the same temperature characteristics were observed regardless of the order of the resonance mode. To interpret this phenomenon, a new equation for predicting the temperature characteristics of the fundamental mode (first mode) for the double-layered resonator was created using the electric flux density ratio generated in the two substrates. The expected values using this equation were in good agreement with the result of the first mode temperature characteristics.

Original language	English
Pages (from-to)	870-877
Number of pages	8
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	69
Issue number	2
DOIs	https://doi.org/10.1109/TUFFC.2021.3121782
Publication status	Published - 2022 Feb 1

Keywords

Frequency control
Frequency measurement
Optical resonators
Resonant frequency
Substrates
Temperature
Temperature measurement

ASJC Scopus subject areas

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

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10.1109/TUFFC.2021.3121782

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Ohashi, Y., Owada, Y., Yokota, Y., Yoshikawa, A., Kurosawa, S., Kamada, K., Sato, H., Toyoda, S., Yamaji, A., Yoshino, M., & Hanada, T. (2022). Temperature Characteristics of Resonance Frequency for Double-Layered Thickness-Shear Resonator. IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 69(2), 870-877. https://doi.org/10.1109/TUFFC.2021.3121782

Ohashi, Y, Owada, Y, Yokota, Y , Yoshikawa, A , Kurosawa, S , Kamada, K , Sato, H , Toyoda, S , Yamaji, A , Yoshino, M & Hanada, T 2022, 'Temperature Characteristics of Resonance Frequency for Double-Layered Thickness-Shear Resonator', IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol. 69, no. 2, pp. 870-877. https://doi.org/10.1109/TUFFC.2021.3121782

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abstract = "The effect of the difference in the thickness ratio of the double-layered thickness-shear resonator on the temperature characteristics of the resonance frequency was investigated using a Ca3TaGa3Si2O14 (CTGS) single crystal. Three specimens with thickness ratios of ${x} =0.25$ , 0.33, and 0.50 were prepared using $122^{\circ } ~{Y}$ - and $171^{\circ }~{Y}$ -cut CTGS substrates. For the specimens with ${x} =0.25$ and 0.33, the temperature characteristics varied depending on the order of the resonance mode. For the specimen with ${x} =0.50$ , on the other hand, almost the same temperature characteristics were observed regardless of the order of the resonance mode. To interpret this phenomenon, a new equation for predicting the temperature characteristics of the fundamental mode (first mode) for the double-layered resonator was created using the electric flux density ratio generated in the two substrates. The expected values using this equation were in good agreement with the result of the first mode temperature characteristics.",

keywords = "Frequency control, Frequency measurement, Optical resonators, Resonant frequency, Substrates, Temperature, Temperature measurement",

author = "Yuji Ohashi and Yusuke Owada and Yuui Yokota and Akira Yoshikawa and Shunsuke Kurosawa and Kei Kamada and Hiroki Sato and Satoshi Toyoda and Akihiro Yamaji and Masao Yoshino and Takashi Hanada",

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doi = "10.1109/TUFFC.2021.3121782",

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AU - Ohashi, Yuji

AU - Owada, Yusuke

AU - Yokota, Yuui

AU - Yoshikawa, Akira

AU - Kurosawa, Shunsuke

AU - Kamada, Kei

AU - Sato, Hiroki

AU - Toyoda, Satoshi

AU - Yamaji, Akihiro

AU - Yoshino, Masao

AU - Hanada, Takashi

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N2 - The effect of the difference in the thickness ratio of the double-layered thickness-shear resonator on the temperature characteristics of the resonance frequency was investigated using a Ca3TaGa3Si2O14 (CTGS) single crystal. Three specimens with thickness ratios of ${x} =0.25$ , 0.33, and 0.50 were prepared using $122^{\circ } ~{Y}$ - and $171^{\circ }~{Y}$ -cut CTGS substrates. For the specimens with ${x} =0.25$ and 0.33, the temperature characteristics varied depending on the order of the resonance mode. For the specimen with ${x} =0.50$ , on the other hand, almost the same temperature characteristics were observed regardless of the order of the resonance mode. To interpret this phenomenon, a new equation for predicting the temperature characteristics of the fundamental mode (first mode) for the double-layered resonator was created using the electric flux density ratio generated in the two substrates. The expected values using this equation were in good agreement with the result of the first mode temperature characteristics.

AB - The effect of the difference in the thickness ratio of the double-layered thickness-shear resonator on the temperature characteristics of the resonance frequency was investigated using a Ca3TaGa3Si2O14 (CTGS) single crystal. Three specimens with thickness ratios of ${x} =0.25$ , 0.33, and 0.50 were prepared using $122^{\circ } ~{Y}$ - and $171^{\circ }~{Y}$ -cut CTGS substrates. For the specimens with ${x} =0.25$ and 0.33, the temperature characteristics varied depending on the order of the resonance mode. For the specimen with ${x} =0.50$ , on the other hand, almost the same temperature characteristics were observed regardless of the order of the resonance mode. To interpret this phenomenon, a new equation for predicting the temperature characteristics of the fundamental mode (first mode) for the double-layered resonator was created using the electric flux density ratio generated in the two substrates. The expected values using this equation were in good agreement with the result of the first mode temperature characteristics.

KW - Frequency control

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KW - Substrates

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KW - Temperature measurement

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Temperature Characteristics of Resonance Frequency for Double-Layered Thickness-Shear Resonator

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