TEM observation of liquid-phase bonded aluminum-silicon/aluminum nitride hetero interface

Christine Marie Montesa, Naoya Shibata, Tetsuya Tohei, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    Liquid-phase bonded aluminum-silicon/aluminum nitride interface structure was investigated using high-resolution transmission electron microscopy. A textured layer of aluminum formed a stable orientation relationship with aluminum nitride, which showed Al(111) to be tilted by about 4° with respect to the AlN(0001) interface plane. The unique orientation relationship between Al and AlN was predicted as one of the stable orientation relationships using coincidence of reciprocal lattice point method, which surveys the degree of geometrical coherency between two crystals in three-dimensional space. A stable orientation relationship was found to be (001)[110]Al//(2̄203)[11̄20] AlN.

    Original languageEnglish
    Pages (from-to)4392-4396
    Number of pages5
    JournalJournal of Materials Science
    Volume46
    Issue number12
    DOIs
    Publication statusPublished - 2011 Jun 1

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

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