TEM in situ observation of fracture behavior in ceramic materials

S. Ii; C. Iwamoto; K. Matsunaga; T. Yamamoto; Y. Ikuhara

doi:10.1016/j.apsusc.2004.09.019

TEM in situ observation of fracture behavior in ceramic materials

S. Ii, C. Iwamoto, K. Matsunaga, T. Yamamoto, Y. Ikuhara

Research output: Contribution to journal › Article

14 Citations (Scopus)

Abstract

The atomic structures of crack walls due to cleavage fracture in silicon nitride (Si ₃ N ₄ ) and magnesium oxide (MgO) have been investigated by in situ straining transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM) at room temperature. In the case of Si ₃ N ₄ , the crack walls on the (1 1̄ 0 0) plane were atomically flat, which indicates that the crack propagated along a particular crystal plane without deflection. On the other hand, the cleaved crack walls in MgO were not atomically flat but contained a number of square-shaped steps with a few {0 1 0} atomic layers in height. Thus, it can be said that the cleavage crack was deflected at the atomic level during its rapid propagation. The origin of their step structures is discussed using results from molecular dynamics (MD) simulations.

Original language	English
Pages (from-to)	68-74
Number of pages	7
Journal	Applied Surface Science
Volume	241
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.apsusc.2004.09.019
Publication status	Published - 2005 Feb 28

Keywords

Cleavage fracture
High-resolution electron microscopy
In situ observation
Magnesium oxide (MgO)
Silicon nitride (Si N )
Transmission electron microscopy

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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Ii, S., Iwamoto, C., Matsunaga, K., Yamamoto, T., & Ikuhara, Y. (2005). TEM in situ observation of fracture behavior in ceramic materials. Applied Surface Science, 241(1-2 SPEC. ISS.), 68-74. https://doi.org/10.1016/j.apsusc.2004.09.019

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title = "TEM in situ observation of fracture behavior in ceramic materials",

abstract = " The atomic structures of crack walls due to cleavage fracture in silicon nitride (Si 3 N 4 ) and magnesium oxide (MgO) have been investigated by in situ straining transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM) at room temperature. In the case of Si 3 N 4 , the crack walls on the (1 {\=1} 0 0) plane were atomically flat, which indicates that the crack propagated along a particular crystal plane without deflection. On the other hand, the cleaved crack walls in MgO were not atomically flat but contained a number of square-shaped steps with a few {0 1 0} atomic layers in height. Thus, it can be said that the cleavage crack was deflected at the atomic level during its rapid propagation. The origin of their step structures is discussed using results from molecular dynamics (MD) simulations.",

keywords = "Cleavage fracture, High-resolution electron microscopy, In situ observation, Magnesium oxide (MgO), Silicon nitride (Si N ), Transmission electron microscopy",

author = "S. Ii and C. Iwamoto and K. Matsunaga and T. Yamamoto and Y. Ikuhara",

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T1 - TEM in situ observation of fracture behavior in ceramic materials

AU - Ii, S.

AU - Iwamoto, C.

AU - Matsunaga, K.

AU - Yamamoto, T.

AU - Ikuhara, Y.

PY - 2005/2/28

Y1 - 2005/2/28

N2 - The atomic structures of crack walls due to cleavage fracture in silicon nitride (Si 3 N 4 ) and magnesium oxide (MgO) have been investigated by in situ straining transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM) at room temperature. In the case of Si 3 N 4 , the crack walls on the (1 1̄ 0 0) plane were atomically flat, which indicates that the crack propagated along a particular crystal plane without deflection. On the other hand, the cleaved crack walls in MgO were not atomically flat but contained a number of square-shaped steps with a few {0 1 0} atomic layers in height. Thus, it can be said that the cleavage crack was deflected at the atomic level during its rapid propagation. The origin of their step structures is discussed using results from molecular dynamics (MD) simulations.

AB - The atomic structures of crack walls due to cleavage fracture in silicon nitride (Si 3 N 4 ) and magnesium oxide (MgO) have been investigated by in situ straining transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM) at room temperature. In the case of Si 3 N 4 , the crack walls on the (1 1̄ 0 0) plane were atomically flat, which indicates that the crack propagated along a particular crystal plane without deflection. On the other hand, the cleaved crack walls in MgO were not atomically flat but contained a number of square-shaped steps with a few {0 1 0} atomic layers in height. Thus, it can be said that the cleavage crack was deflected at the atomic level during its rapid propagation. The origin of their step structures is discussed using results from molecular dynamics (MD) simulations.

KW - Cleavage fracture

KW - High-resolution electron microscopy

KW - In situ observation

KW - Magnesium oxide (MgO)

KW - Silicon nitride (Si N )

KW - Transmission electron microscopy

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