Technical development of profile measurement for the soft X-ray via compton backward scattering

T. Saito, D. Oshima, K. Ueyama, S. Hidume, Y. Minamiguchi, M. Hama, Washio, R. Kuroda, S. Kashiwagi, J. Urakawa, H. Hayano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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Engineering & Materials Science