Technical development of profile measurement for the soft X-ray via compton backward scattering

T. Saito, D. Oshima, K. Ueyama, S. Hidume, Y. Minamiguchi, M. Hama, Washio, R. Kuroda, S. Kashiwagi, J. Urakawa, H. Hayano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A compact X-ray source is required by such various fields as material development, biological science, and medical treatment. At Waseda University, we have succeeded to generate the soft X-ray of the wavelength within so-called water window region (250-500eV) via Compton backward scattering [1, 2] between 1047nm Nd:YLF laser and 4.6MeV high quality electron beam. Although this method equips some useful characters, e.g. high intensity, short pulse, energy variableness, etc, the X-ray generating system is compact enough to fit in tabletop size. In the next step, there rises two principal tasks; To make the soft X-ray intensity higher, 2-pass amplifier was utilized. To progress X-ray profile measurement techniques as preliminary experiments for biomicroscopy, we planned to irradiate X-ray to a resist film which is previously exposed by UV-lamp or get images with X-ray CCD. In this conference, we will show the experimental results and some future plans.

Original languageEnglish
Title of host publicationProceedings of the Particle Accelerator Conference, PAC 2005
Pages1260-1262
Number of pages3
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventParticle Accelerator Conference, PAC 2005 - Knoxville, TN, United States
Duration: 2005 May 162005 May 20

Publication series

NameProceedings of the IEEE Particle Accelerator Conference
Volume2005

Conference

ConferenceParticle Accelerator Conference, PAC 2005
Country/TerritoryUnited States
CityKnoxville, TN
Period05/5/1605/5/20

ASJC Scopus subject areas

  • Engineering(all)

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