TY - JOUR
T1 - Tandem-phase zone-plate optics for high-energy X-ray focusing
AU - Kagoshima, Yasushi
AU - Takano, Hidekazu
AU - Koyama, Takahisa
AU - Tsusaka, Yoshiyuki
AU - Saikubo, Akihiko
PY - 2011/2
Y1 - 2011/2
N2 - An optical system consisting of two phase zone plates closely arranged in tandem was constructed for focusing high-energy X-rays. The phase zone plates were made from tantalum and their combined thickness was 4.8 μm. An ideal diffraction efficiency of 30% is expected at 30 keV, which is about 3 times higher than that of a single zone plate. The focusing properties at 30 keV were studied both numerically and experimentally. The coaxial tandem arrangement was precisely achieved by observing Young's interference patterns in the far-field produced by the two point foci. A focus size of ̃4 μm was obtained. The photon flux density was 2.2 × 1013 photons/s/mm2, which is 2.4 and 85 times higher than that obtained with a single zone plate and without focusing, respectively. The focused beam was used for scanning X-ray fluorescence microscopy and the residual tin distribution on a float glass surface was imaged.
AB - An optical system consisting of two phase zone plates closely arranged in tandem was constructed for focusing high-energy X-rays. The phase zone plates were made from tantalum and their combined thickness was 4.8 μm. An ideal diffraction efficiency of 30% is expected at 30 keV, which is about 3 times higher than that of a single zone plate. The focusing properties at 30 keV were studied both numerically and experimentally. The coaxial tandem arrangement was precisely achieved by observing Young's interference patterns in the far-field produced by the two point foci. A focus size of ̃4 μm was obtained. The photon flux density was 2.2 × 1013 photons/s/mm2, which is 2.4 and 85 times higher than that obtained with a single zone plate and without focusing, respectively. The focused beam was used for scanning X-ray fluorescence microscopy and the residual tin distribution on a float glass surface was imaged.
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U2 - 10.1143/JJAP.50.022503
DO - 10.1143/JJAP.50.022503
M3 - Article
AN - SCOPUS:79951937269
VL - 50
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 2
M1 - 022503
ER -