TY - JOUR
T1 - Synthesis evaluation of nitrogen atom encapsulated fullerenes by optical emission spectra in nitrogen plasmas
AU - Miyanaga, S.
AU - Kaneko, T.
AU - Ishida, H.
AU - Hatakeyama, R.
N1 - Funding Information:
This work was partly carried out at the Evaluation and Analysis Center, Research Institute of Electrical Communication, Tohoku University. This work was supported by a Grant-in-Aid for Scientific Research from the Ministry of Education, Culture, Sport, Science and Technology , Japan.
PY - 2010/4/30
Y1 - 2010/4/30
N2 - The nitrogen atom encapsulated fullerene (N@C60) with relatively high yield has been synthesized by a plasma irradiation method. We have examined the relationship between optical emission spectra of a radio frequency (RF) discharge nitrogen plasma and the synthesis yield of N@C60. As a consequence, the increasing amount of nitrogen molecule ions (N2+) impinging on the sublimated fullerenes are found to enhance the synthesis of N@C60. Furthermore, it is clarified that there is an optimum condition of the nitrogen plasma for the high-yield synthesis of N@C60, which is generated under lower gas pressure and is irradiated to the larger amount of fullerenes.
AB - The nitrogen atom encapsulated fullerene (N@C60) with relatively high yield has been synthesized by a plasma irradiation method. We have examined the relationship between optical emission spectra of a radio frequency (RF) discharge nitrogen plasma and the synthesis yield of N@C60. As a consequence, the increasing amount of nitrogen molecule ions (N2+) impinging on the sublimated fullerenes are found to enhance the synthesis of N@C60. Furthermore, it is clarified that there is an optimum condition of the nitrogen plasma for the high-yield synthesis of N@C60, which is generated under lower gas pressure and is irradiated to the larger amount of fullerenes.
KW - Electron spin resonance
KW - Fullerene
KW - Optical emission spectrum
KW - Radio frequency plasma
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U2 - 10.1016/j.tsf.2009.11.049
DO - 10.1016/j.tsf.2009.11.049
M3 - Article
AN - SCOPUS:77949431797
VL - 518
SP - 3509
EP - 3512
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 13
ER -