SWAN: Swarm-Based Low-Complexity Scheme for PAPR Reduction

Luis F. Abanto-Leon, Gek Hong Allyson Sim, Matthias Hollick, Amnart Boonkajay, Fumiyuki Adachi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Cyclically shifted partial transmit sequences (CS-PTS) has conventionally been used in SISO systems for PAPR reduction of OFDM signals. Compared to other techniques, CS-PTS attains superior performance. Nevertheless, due to the exhaustive search requirement, it demands excessive computational complexity. In this paper, we adapt CS-PTS to operate in a MIMO framework, where singular value decomposition (SVD) precoding is employed. We also propose SWAN, a novel optimization method based on swarm intelligence to circumvent the exhaustive search. SWAN not only provides a significant reduction in computational complexity, but it also attains a fair balance between optimality and complexity. Through simulations, we show that SWAN achieves near-optimal performance at a much lower complexity than other competing approaches.

Original languageEnglish
Title of host publication2020 IEEE Global Communications Conference, GLOBECOM 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728182988
DOIs
Publication statusPublished - 2020 Dec
Event2020 IEEE Global Communications Conference, GLOBECOM 2020 - Virtual, Taipei, Taiwan, Province of China
Duration: 2020 Dec 72020 Dec 11

Publication series

Name2020 IEEE Global Communications Conference, GLOBECOM 2020 - Proceedings

Conference

Conference2020 IEEE Global Communications Conference, GLOBECOM 2020
CountryTaiwan, Province of China
CityVirtual, Taipei
Period20/12/720/12/11

Keywords

  • MIMO
  • OFDM
  • PAPR reduction
  • artificial intelligence.
  • swarm intelligence

ASJC Scopus subject areas

  • Media Technology
  • Modelling and Simulation
  • Instrumentation
  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Software
  • Safety, Risk, Reliability and Quality

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