Surface traveling X-rays from organic thin film

K. Hayashi, J. Kawai

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)

Abstract

When a white X-ray beam impinges on a flat surface under grazing incidence conditions, X-rays at certain energies travel along the material surface. These X-rays are called `surface traveling X-rays' in this paper. We observed the surface traveling X-rays from n-C33H68/Si, and found two types of peaks through the n-C33H68 layer. The energies of these peaks can be calculated from the structure of the sample. Here, the density and thickness of n-C33H68 film were determined by fitting the calculated energies to the experimental ones.

Original languageEnglish
Pages (from-to)139-142
Number of pages4
JournalPhysica B: Condensed Matter
Volume283
Issue number1-3
DOIs
Publication statusPublished - 2000 Jun
Event6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6) - Noordwijkerhout, Neth
Duration: 1999 Sep 121999 Sep 17

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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