Surface structure of 3C-SiC(111) grown on Si(111) surface by C60 precursor

C. W. Hu, A. Kasuya, Shozo Suto, A. Wawro, Y. Nishina

Research output: Contribution to journalArticlepeer-review

Abstract

The surface structure of cubic 3C-SiC(111) films prepared by thermal reaction of a Si(111) substrate with C60 molecules has been studied by combined in situ measurements of scanning tunneling microscopy and high resolution electron energy loss spectroscopy (HREELS-STM). The (2×n) surface reconstructions such as (2×2), (2×3) were observed under low reaction temperatures (<900°C), and the Si-terminated SiC(111)-(3×3) was obtained by annealing the sample at higher temperatures (∼1100°C). Optical surface phonon energies of 113±2 meV for SiC prepared at low temperatures and 116±2 meV for the films with (3×3) surface reconstruction were measured. The diffusivity of Si atoms from the substrate through the SiC film at various temperatures is suggested as the reason for the formation of different surface reconstructions of the SiC.

Original languageEnglish
Number of pages1
JournalApplied Physics Letters
Publication statusPublished - 1995 Dec 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Surface structure of 3C-SiC(111) grown on Si(111) surface by C<sub>60</sub> precursor'. Together they form a unique fingerprint.

Cite this