Surface segregation of Pt-Rh alloys

N. Sano, T. Sakurai

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)


    An atom-probe field ion microscope (APFIM) has been employed to determine the surface composition and depth profiles of the (100) plane of Pt-20, 40 wt. % (32.1, 55.8 at. %) Rh alloys. The enrichment of Pt at the top surface layer on annealing at 700°C (∼ 1000 K) was observed, agreeing with previous studies by Auger electron spectroscopy, ion scattering spectroscopy, and APFIM. On annealing below 600°C, however, a reversed surface segregation, Rh enrichment at the first surface, has been observed even without any impurity atoms such as S and P. Upon annealing up to 700°C in the presence of oxygen, we found no appreciable oxidation of the alloy samples, instead, there appeared chemisorbed oxygen forming an overlayer.

    Original languageEnglish
    Pages (from-to)3421-3424
    Number of pages4
    JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
    Issue number4
    Publication statusPublished - 1990 Jul 1


    • (PtRh)
    • (PtRh):(S;P)
    • Annealing
    • Binary alloys
    • Chemical composition
    • Chemisorption
    • Depth profiles
    • Depth profiles
    • High temperature
    • Ion microscopes
    • Oxygen
    • Platinum alloys
    • Rhodium alloys
    • Segregation
    • Surface analysis

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films


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