Abstract
An atom-probe field ion microscope (APFIM) has been employed to determine the surface composition and depth profiles of the (100) plane of Pt-20, 40 wt. % (32.1, 55.8 at. %) Rh alloys. The enrichment of Pt at the top surface layer on annealing at 700°C (∼ 1000 K) was observed, agreeing with previous studies by Auger electron spectroscopy, ion scattering spectroscopy, and APFIM. On annealing below 600°C, however, a reversed surface segregation, Rh enrichment at the first surface, has been observed even without any impurity atoms such as S and P. Upon annealing up to 700°C in the presence of oxygen, we found no appreciable oxidation of the alloy samples, instead, there appeared chemisorbed oxygen forming an overlayer.
| Original language | English |
|---|---|
| Pages (from-to) | 3421-3424 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 8 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1990 Jul 1 |
Keywords
- (PtRh)
- (PtRh):(S;P)
- Annealing
- Binary alloys
- Chemical composition
- Chemisorption
- Depth profiles
- Depth profiles
- High temperature
- Ion microscopes
- Oxygen
- Platinum alloys
- Rhodium alloys
- Segregation
- Surface analysis
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films