Surface segregation of chromium in a copper-chromium alloy and its effect on formation of a native oxide layer

Shigeru Suzuki, Yukio Ishikawa, Minoru Isshiki, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) has been used for studying the surface segregation of chromium in a copper-0.4 mass% chromium alloy. The influence of the chromium segregation on native oxide layers formed on the surface in this alloy has also been studied. According to a simple layered model assuming thin homogeneous layers, the average surface concentration chromium was found to increase up to about 15 at% on the alloy surface by annealing up to about 1000 K under ultra high vacuum. The AR-XPS results for the alloy surface with chromium segregation, which was exposed to air, showed that the growth of the native oxide layer of copper was not significantly suppressed by segregated chromium. This small influence of chromium segregation on the native oxide layer is considered to result from the relatively high oxidation rate of copper and the microscopic heterogeneity of chromium segregation on the alloy surface.

Original languageEnglish
Pages (from-to)2523-2526
Number of pages4
JournalMaterials Transactions
Volume43
Issue number10
DOIs
Publication statusPublished - 2002 Oct

Keywords

  • Angle resolved x-ray photoelectron spectroscopy
  • Copper-chromium alloy
  • Oxidation
  • Surface segregation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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