Surface plasmon microscopy using an energy-filtered low energy electron microscope

Y. Fujikawa, T. Sakurai, R. M. Tromp

    Research output: Contribution to journalArticlepeer-review

    34 Citations (Scopus)

    Abstract

    We present low energy electron microscope (LEEM) spectromicroscopy studies of surface plasmons, localized on micro- and nanoscale epitaxial Ag islands. Excellent agreement is found in a direct comparison of wave vector dependent plasmon intensity with theory, demonstrating that high quality quantitative data can be obtained with a large improvement in both spatial and temporal resolution over traditional electron scattering experiments. The plasmon signal from Ag islands is successfully imaged with a spatial resolution of less than 35 nm. LEEM based plasmon spectromicroscopy promises to be a powerful tool for furthering our understanding of nanoplasmonics.

    Original languageEnglish
    Article number126803
    JournalPhysical Review Letters
    Volume100
    Issue number12
    DOIs
    Publication statusPublished - 2008 Mar 25

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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