Surface core-level shift photoelectron diffraction study of β-SiC(001)-c(2 × 2) surface

M. Shimomura, H. W. Yeom, B. S. Mun, C. S. Fadley, S. Hara, S. Yoshida, S. Kono

    Research output: Contribution to journalConference articlepeer-review

    10 Citations (Scopus)

    Abstract

    Surface core-level shift energy scan photoelectron diffraction (PED) was used to distinguish the two structural models of the C-terminated β-SiC(001)-c(2 × 2) surface under debate. An experimental PED curve of the surface C 1s component is in good agreement only with the simulated curve of the unusual bridge dimer model denying the conventional dimer model. The optimized structural parameters of this bridge dimer model are 1.22, 1.84 and 2.7 angstrom for the C-C, C-Si and Si-Si bond lengths, respectively, in agreement with recent theoretical calculations.

    Original languageEnglish
    Pages (from-to)237-241
    Number of pages5
    JournalSurface Science
    Volume438
    Issue number1-3
    DOIs
    Publication statusPublished - 1999 Sep 10
    EventProceedings of the 1998 International Symposium on Surface and Interface: Properties of Different Symmetry Crossing 98 (ISSI PDSC-98) - Tokyo, Jpn
    Duration: 1998 Nov 191998 Nov 21

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

    Fingerprint Dive into the research topics of 'Surface core-level shift photoelectron diffraction study of β-SiC(001)-c(2 × 2) surface'. Together they form a unique fingerprint.

    Cite this