Surface core-level photoelectron diffraction from Si dimers at the Si(001)- (2×1) surface

E. L. Bullock, R. Gunnella, L. Patthey, T. Abukawa, S. Kono, C. R. Natoli, L. S.O. Johansson

Research output: Contribution to journalArticlepeer-review

104 Citations (Scopus)

Abstract

Intensity variations of the dimer derived surface shifted Si 2p core level from single domain Si(001)- (2×1) have been measured as a function of azimuthal angle. Comparisons to multiple scattering calculations show that such measurements provide a method for determining the structural origins of surface shifted core levels. In addition, a structural analysis illustrates the sensitivity of this method to the detailed structure around the emitting atoms. In this case, a determination of the surface geometry indicates that the dimer bond is tilted 19.0°with respect to the surface.

Original languageEnglish
Pages (from-to)2756-2759
Number of pages4
JournalPhysical review letters
Volume74
Issue number14
DOIs
Publication statusPublished - 1995

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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