Abstract
Corrugated zone roughness of a circular Cu/Al multilayer Fresnel zone plate (FZP) was successfully suppressed. Such a zone corrugation was often observed in the concentric multilayers prepared using a conventional sputtering apparatus. The zone corrugation is a consequence of the oblique component of the deposition flux (i.e. shadowing effect). We therefore set a cylindrical slit (a linear slit on the surface of a stainless steel cylindrical shield) between the target and the substrate in order to eliminate the oblique flux. As a result, the zone corrugation was not observed using a scanning ion microscope (SIM).
Original language | English |
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Pages (from-to) | 4747-4748 |
Number of pages | 2 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 40 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2001 Jul |
Externally published | Yes |
Keywords
- Columnar structure
- Cylindrical slit
- Focused ion beam (FIB)
- Fresnel zone plate
- Hard X-ray
- Magnetron sputtering
- Scanning ion microscope (SIM)
- Synchrotron radiation
- Void
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)