Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM

Satoshi Suzuki, Zentaro Akase, Daisuke Shindo, Hisatake Kondo

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We investigate the effectiveness of utilizing a conductive probe for a transmission electron microscope (TEM) to suppress charging caused by electron irradiation. To do this, the electric field around a charged collagen fibril was visualized by electron holography and then quantitatively analyzed by computer simulations. The electric field changed noticeably when the conductive probe was moved near the specimen and charging was drastically suppressed when the conductive probe directly touched the charged specimen. The causes of the change in the electric field and suppression of charging are briefly discussed.

Original languageEnglish
Pages (from-to)451-455
Number of pages5
JournalJournal of Electron Microscopy
Volume62
Issue number4
DOIs
Publication statusPublished - 2013 Aug

Keywords

  • charging effect
  • electric field
  • electron holography
  • piezo drive
  • probe
  • secondary electron

ASJC Scopus subject areas

  • Instrumentation

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