Abstract
Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2×2×2μm3 cytidine, 600×600×300nm3 BaTiO3, and 1×1×1μm3 silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendellösung method and do not require absorption and extinction corrections.
Original language | English |
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Title of host publication | SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation |
Pages | 147-150 |
Number of pages | 4 |
Volume | 1234 |
DOIs | |
Publication status | Published - 2010 Aug 3 |
Externally published | Yes |
Event | 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia Duration: 2009 Sep 27 → 2009 Oct 2 |
Other
Other | 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 |
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Country/Territory | Australia |
City | Melbourne, VIC |
Period | 09/9/27 → 09/10/2 |
Keywords
- focused X-ray beam
- phase zone plate
- single crystal structure analysis
- structure factor
- X-ray diffraction
ASJC Scopus subject areas
- Physics and Astronomy(all)