Submicrometer single crystal diffractometry for highly accurate structure determination

Nobuhiro Yasuda; Yoshimitsu Fukuyama; Koshiro Toriumi; Shigeru Kimura; Masaki Takata

doi:10.1063/1.3463161

Submicrometer single crystal diffractometry for highly accurate structure determination

Nobuhiro Yasuda, Yoshimitsu Fukuyama, Koshiro Toriumi, Shigeru Kimura, Masaki Takata

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

39 Citations (Scopus)

Abstract

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2×2×2μm³ cytidine, 600×600×300nm³ BaTiO₃, and 1×1×1μm³ silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendellösung method and do not require absorption and extinction corrections.

Original language	English
Title of host publication	SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
Pages	147-150
Number of pages	4
Volume	1234
DOIs	https://doi.org/10.1063/1.3463161
Publication status	Published - 2010 Aug 3
Externally published	Yes
Event	10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia Duration: 2009 Sep 27 → 2009 Oct 2

Other

Other	10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
Country	Australia
City	Melbourne, VIC
Period	09/9/27 → 09/10/2

Keywords

focused X-ray beam
phase zone plate
single crystal structure analysis
structure factor
X-ray diffraction

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.3463161

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Cite this

Yasuda, N., Fukuyama, Y., Toriumi, K., Kimura, S., & Takata, M. (2010). Submicrometer single crystal diffractometry for highly accurate structure determination. In SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation (Vol. 1234, pp. 147-150) https://doi.org/10.1063/1.3463161

Submicrometer single crystal diffractometry for highly accurate structure determination. / Yasuda, Nobuhiro; Fukuyama, Yoshimitsu; Toriumi, Koshiro; Kimura, Shigeru; Takata, Masaki.

SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation. Vol. 1234 2010. p. 147-150.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yasuda, N, Fukuyama, Y, Toriumi, K, Kimura, S & Takata, M 2010, Submicrometer single crystal diffractometry for highly accurate structure determination. in SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation. vol. 1234, pp. 147-150, 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009, Melbourne, VIC, Australia, 09/9/27. https://doi.org/10.1063/1.3463161

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abstract = "Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2×2×2μm3 cytidine, 600×600×300nm3 BaTiO3, and 1×1×1μm3 silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendell{\"o}sung method and do not require absorption and extinction corrections.",

keywords = "focused X-ray beam, phase zone plate, single crystal structure analysis, structure factor, X-ray diffraction",

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