Subgap structures in the current-voltage properties of La2-xSrxCuO4 intrinsic Josephson junctions

Y. Uematsu; N. Sasaki; Y. Mizugaki; K. Nakajima; T. Yamashita; S. Watauchi; I. Tanaka

doi:10.1016/S0921-4534(01)00690-6

Subgap structures in the current-voltage properties of La_2-xSr_xCuO₄ intrinsic Josephson junctions

Y. Uematsu, N. Sasaki, Y. Mizugaki, K. Nakajima, T. Yamashita, S. Watauchi, I. Tanaka

Research Institute of Electrical Communication (RIEC)

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

We investigated current-voltage (I-V) properties of intrinsic Josephson junctions in c-axis micro-bridges (∼20 μm² area for ab plane and ∼1 μm length along the c-axis) of La_2-xSr_xCuO₄ single crystals. The micro-bridges were fabricated by the focused-ion-beam etching technique. We found periodic conductance peaks below the gap voltage in the RCSJ-like I-V curves of the intrinsic Josephson junctions. We discuss possible explanations and show that the subgap structures can be explained by coupling between ac Josephson oscillation and Josephson plasma oscillation in La_2-xSr_xCuO₄.

Original language	English
Pages (from-to)	290-295
Number of pages	6
Journal	Physica C: Superconductivity and its applications
Volume	362
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4534(01)00690-6
Publication status	Published - 2001 Sep

Keywords

Intrinsic Jsephson effect
LaSrCuO
Subgap structure

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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title = "Subgap structures in the current-voltage properties of La2-xSrxCuO4 intrinsic Josephson junctions",

abstract = "We investigated current-voltage (I-V) properties of intrinsic Josephson junctions in c-axis micro-bridges (∼20 μm2 area for ab plane and ∼1 μm length along the c-axis) of La2-xSrxCuO4 single crystals. The micro-bridges were fabricated by the focused-ion-beam etching technique. We found periodic conductance peaks below the gap voltage in the RCSJ-like I-V curves of the intrinsic Josephson junctions. We discuss possible explanations and show that the subgap structures can be explained by coupling between ac Josephson oscillation and Josephson plasma oscillation in La2-xSrxCuO4.",

keywords = "Intrinsic Jsephson effect, LaSrCuO, Subgap structure",

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T1 - Subgap structures in the current-voltage properties of La2-xSrxCuO4 intrinsic Josephson junctions

AU - Uematsu, Y.

AU - Sasaki, N.

AU - Mizugaki, Y.

AU - Nakajima, K.

AU - Yamashita, T.

AU - Watauchi, S.

AU - Tanaka, I.

PY - 2001/9

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N2 - We investigated current-voltage (I-V) properties of intrinsic Josephson junctions in c-axis micro-bridges (∼20 μm2 area for ab plane and ∼1 μm length along the c-axis) of La2-xSrxCuO4 single crystals. The micro-bridges were fabricated by the focused-ion-beam etching technique. We found periodic conductance peaks below the gap voltage in the RCSJ-like I-V curves of the intrinsic Josephson junctions. We discuss possible explanations and show that the subgap structures can be explained by coupling between ac Josephson oscillation and Josephson plasma oscillation in La2-xSrxCuO4.

AB - We investigated current-voltage (I-V) properties of intrinsic Josephson junctions in c-axis micro-bridges (∼20 μm2 area for ab plane and ∼1 μm length along the c-axis) of La2-xSrxCuO4 single crystals. The micro-bridges were fabricated by the focused-ion-beam etching technique. We found periodic conductance peaks below the gap voltage in the RCSJ-like I-V curves of the intrinsic Josephson junctions. We discuss possible explanations and show that the subgap structures can be explained by coupling between ac Josephson oscillation and Josephson plasma oscillation in La2-xSrxCuO4.

KW - Intrinsic Jsephson effect

KW - LaSrCuO

KW - Subgap structure

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