Subgap structures in the current-voltage properties of La2-xSrxCuO4 intrinsic Josephson junctions

Y. Uematsu, N. Sasaki, Y. Mizugaki, K. Nakajima, T. Yamashita, S. Watauchi, I. Tanaka

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)


We investigated current-voltage (I-V) properties of intrinsic Josephson junctions in c-axis micro-bridges (∼20 μm2 area for ab plane and ∼1 μm length along the c-axis) of La2-xSrxCuO4 single crystals. The micro-bridges were fabricated by the focused-ion-beam etching technique. We found periodic conductance peaks below the gap voltage in the RCSJ-like I-V curves of the intrinsic Josephson junctions. We discuss possible explanations and show that the subgap structures can be explained by coupling between ac Josephson oscillation and Josephson plasma oscillation in La2-xSrxCuO4.

Original languageEnglish
Pages (from-to)290-295
Number of pages6
JournalPhysica C: Superconductivity and its applications
Issue number1-4
Publication statusPublished - 2001 Sep


  • Intrinsic Jsephson effect
  • LaSrCuO
  • Subgap structure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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