Subboundaries in hcp4He crystals studied by SR X-ray topography

Izumi Iwasa, Hideji Suzuki, Takayoshi Suzuki, Tetsuo Nakajima, Ichiro Yonenaga, Haruhiko Suzuki, Hirokazu Koizumi, Yuji Nishio, Joji Ota

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


The internal structure of hcp4He crystals was studied by SR (synchrotron radiation) X-ray topography. Subboundaries in the crystals appeared as black or white bands in the X-ray topographs. In one of the hcp4He crystals, the subboundaries turned out to be flat planes perpendicular to the basal plane. They were small-angle tilt boundaries which consisted of basal edge dislocations. The dislocation spacing in one of the subboundaries was determined to be 800 nm and the total density of the boundary dislocations to be 2.6 × 105 cm-2. The subboundaries in another hcp4He crystal were curved and/or branching, indicating that the crystal was strained.

Original languageEnglish
Pages (from-to)147-165
Number of pages19
JournalJournal of Low Temperature Physics
Issue number1-2
Publication statusPublished - 1995 Jul 1

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics


Dive into the research topics of 'Subboundaries in hcp4He crystals studied by SR X-ray topography'. Together they form a unique fingerprint.

Cite this