Sub-millimeter resolution pressure measurement on free flight model at Mach 1.5 using novel non-intrusive optical technique

Daiki Kurihara, Joseph P. Gonzales, Steven L. Claucherty, Hideki Kiritani, Koji Fujita, Aleksandar Jemcov, Hiroki Nagai, Hirotaka Sakaue

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Chemical Compounds

Engineering & Materials Science