Sub-boundaries in³He and⁴He single crystal and their migration below 1K observed by X-ray topography

The observation of alterations in crystal structure at ultra-low temperatures by X-ray diffraction, made possible by the realization of synchrotron radiation use after a quarter of this century, plays an important role in obtaining an understanding of the base structure of solids. For that, two types of³He-⁴He dilution refrigerators with a modified version of the top-loading facilities were installed at the BL-3C₂ and 6C₁ stations of the Photon Factory. In BL-3C₂, the behaviors of lattice defects in solid helium have been studied by X-ray topography. In this note, the migrations of sub-boundaries in³He and⁴He single-crystals are reported as being the result of an annealing effect. After annealing hcp⁴He single crystals for 80min at 0.5K, no change in crystallographic orientations could be easily observed from white SR X-ray topographs. In the same type topographs of bcc³He single crystals after annealing for several hours at 03K, migration of sub-boundaries were conspicuously discerned.