Abstract
We describe the microfabrication process of a granular nanobridge structure consisting of electrodes separated by a nanometer-sized gap in which a thin insulating Co-Al-O granular film is filled, and discuss the observed Coulomb blockade with a clear threshold voltage (Vth) and the enhanced tunnel magnetoresistance of about 30% at a voltage slightly above Vth. Recent results of our scanning tunneling microscopy studies to clarify the topographic features and single electron tunneling phenomena on the surface of Co-Al-O granular films are also presented.
Original language | English |
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Pages (from-to) | 120-125 |
Number of pages | 6 |
Journal | Materials Science and Engineering B: Solid-State Materials for Advanced Technology |
Volume | 84 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2001 Jun 5 |
Keywords
- Coulomb blockade
- Focused ion beam etching
- Granular film
- Scanning tunneling microscopy
- Single electron tunneling
- Tunnel magnetoresistance
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering