Study on polymer thin film structure by measurement of free volume hole size

Seisuke Ata, Toshiaki Ougizawa, Makoto Muramatsu, Toshiyuki Ohdaira, Ryoichi Suzuki, Toshitaka Oka, Kenji Ito, Yoshinori Kobayashi

Research output: Contribution to conferencePaperpeer-review

Abstract

Change of properties on polymer thin films has been reported by many researches. However, the cause was not clear yet either surface effect or thinning film effect. On this study, in order to separate the two effects, the temperature dependence of free volume hole size for polystyrene thin films was measured by positron annihilation lifetime spectroscopy (PALS) using slow-positron beam. Decrease of glass transition temperature and increase of thermal expansion coefficient were observed in very thin film(less than 2R g), although the free volume hole size behavior between surface and bulk in thick film was almost the same. That is to say, the change of properties of thin film was caused not only by surface effect, but also by thinning film effect. Moreover, we discussed polymer thin film structure from the viewpoint of entanglements.

Original languageEnglish
Number of pages1
Publication statusPublished - 2006 Oct 19
Externally publishedYes
Event55th SPSJ Annual Meeting - Nagoya, Japan
Duration: 2006 May 242006 May 26

Other

Other55th SPSJ Annual Meeting
CountryJapan
CityNagoya
Period06/5/2406/5/26

Keywords

  • Entanglement
  • Free volume hole size
  • Polystyrene
  • Thin film

ASJC Scopus subject areas

  • Engineering(all)

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