Study on initial process of fs laser ablation dynamics by using soft x-ray laser probe

M. Nishikino, N. Hasegawa, N. Ohnishi, A. M. Ito, Y. Minami, N. A. Inogamov, V. Zakhovsky, A. Ya Faenov, T. Suemoto, T. Kawachi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed the pump and probe interferometer and reflective imaging technique of the metal surfaces during the femto-second laser ablation by using the plasma based soft x-ray laser at the wavelength of 13.9 nm. The pumping laser used for ablation was a Ti: Sapphire laser pulse with the duration of 80 fs pulse at a central wavelength of 795 nm, and had a gaussian spatial profile. By using the x-ray imaging technique, the time resolved image of nano-scaled ablation dynamics was obtained.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
Publication statusPublished - 2016 Dec 16
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 2016 Jun 52016 Jun 10

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
CountryUnited States
CitySan Jose
Period16/6/516/6/10

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Nishikino, M., Hasegawa, N., Ohnishi, N., Ito, A. M., Minami, Y., Inogamov, N. A., Zakhovsky, V., Faenov, A. Y., Suemoto, T., & Kawachi, T. (2016). Study on initial process of fs laser ablation dynamics by using soft x-ray laser probe. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7788924] (2016 Conference on Lasers and Electro-Optics, CLEO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/cleo_si.2016.sth3q.1