Study on extremely thin base SiGe:C HBTs featuring sub 5-ps ECL gate delay

Tatsuya Tominari, Shinichro Wada, Kazuaki Tokunaga, Kaoru Koyu, Maki Kubo, Tsutomu Udo, Motoshi Seto, Kenichi Ohhata, Hideyuki Hosoe, Yukihiro Kiyota, Katsuyoshi Washio, Takashi Hashimoto

Research output: Contribution to conferencePaperpeer-review

12 Citations (Scopus)

Fingerprint Dive into the research topics of 'Study on extremely thin base SiGe:C HBTs featuring sub 5-ps ECL gate delay'. Together they form a unique fingerprint.

Engineering & Materials Science