Study of the radiation hardness of a two-phase CCD sensor

K. D. Stefanov, T. Tsukamoto, A. Miyamoto, Y. Sugimoto, N. Tamura, K. Abe, T. Nagamine, T. Aso

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The radiation hardness of a two-phase CCD sensor has been studied. The devices were operated in Multi-Pinned Phase (MPP) mode for reduced dark current, and irradiated by electrons and neutrons. Spurious dark current was observed in the electron-irradiated CCD's and explained by impact ionization by holes, released from defect states near the Si-SiO2 interface. A model describing the charge transfer inefficiency (CTI) in a two-phase CCD as a function of temperature, background charges and clock timing has been developed and applied in a good agreement with the experimental data.

Original languageEnglish
Pages (from-to)136-140
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume453
Issue number1-2
DOIs
Publication statusPublished - 2000 Oct 11

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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