The radiation hardness of a two-phase CCD sensor has been studied. The devices were operated in Multi-Pinned Phase (MPP) mode for reduced dark current, and irradiated by electrons and neutrons. Spurious dark current was observed in the electron-irradiated CCD's and explained by impact ionization by holes, released from defect states near the Si-SiO2 interface. A model describing the charge transfer inefficiency (CTI) in a two-phase CCD as a function of temperature, background charges and clock timing has been developed and applied in a good agreement with the experimental data.
|Number of pages||5|
|Journal||Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment|
|Publication status||Published - 2000 Oct 11|
ASJC Scopus subject areas
- Nuclear and High Energy Physics