Study of Cristallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Y. Yasutomi, Y. Sakaida, N. Hirosaki, Y. Ikuhara

Research output: Contribution to journalArticlepeer-review

Abstract

It is important to analyze microstructures during the sintering stage in order to improve thermal conductivity and mechanical properties of in situ Si3N4 composite. In the present work, the in situ silicon nitride (Si3N4) composite was analyzed by the electron back scattered diffraction (EBSD) method using field emission-scanning electron microscopy with an orientation imaging microscopy analysis device. The following results were obtained. 1) Si3N4 ceramics of hexagonal structure was successfully analyzed by the EBSD method. 2) Elongated Si3N4 particles grew vertically in the alignment direction of seed grains. 3) Growth direction and side planes of the elongated Si3N4 particles were influenced by alignment of seed grains and the hot pressing pressure.

Original languageEnglish
Pages (from-to)31-34
Number of pages4
JournalKey Engineering Materials
Volume161-163
Publication statusPublished - 1999 Jan 1
Externally publishedYes

Keywords

  • Ceramics
  • Crystallographic orientation
  • Elongated SiN Particles
  • Microstructure
  • SiN

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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