Structure of the Bi/Si(111) surface by field-ion scanning tunneling microscopy

C. Park, Raouf Z. Bakhtizin, Tomihiro Hashizume, Toshio Sakurai

    Research output: Contribution to journalArticle

    9 Citations (Scopus)

    Abstract

    A combination of LEED and FI-STM has been used to characterize the Bi/Si(lll) system. Two distinct phases of the f3 x V3- structure formed on the Si(lll) surface are imaged for the first time by STM and are studied as a function of coverage. Trimers of Bi atoms are clearly resolved at 1 ML whereas single Bi atom adsorption are documented at l/3 ML. The atomic geometry of these structures and the development of two phases as a function of coverage are discussed.

    Original languageEnglish
    Pages (from-to)1416-1418
    Number of pages3
    JournalJapanese journal of applied physics
    Volume32
    Issue number3 S
    DOIs
    Publication statusPublished - 1993 Mar

    Keywords

    • Bi adsorption
    • FI-STM
    • Si(111)
    • Surface structure
    • Trimers of Bi atom

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

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