Structure of the Bi/Si(111) surface by field-ion scanning tunneling microscopy

C. Park, Raouf Z. Bakhtizin, Tomihiro Hashizume, Toshio Sakurai

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

A combination of LEED and FI-STM has been used to characterize the Bi/Si(lll) system. Two distinct phases of the f3 x V3- structure formed on the Si(lll) surface are imaged for the first time by STM and are studied as a function of coverage. Trimers of Bi atoms are clearly resolved at 1 ML whereas single Bi atom adsorption are documented at l/3 ML. The atomic geometry of these structures and the development of two phases as a function of coverage are discussed.

Original languageEnglish
Pages (from-to)1416-1418
Number of pages3
JournalJapanese journal of applied physics
Volume32
Issue number3 S
DOIs
Publication statusPublished - 1993 Mar
Externally publishedYes

Keywords

  • Bi adsorption
  • FI-STM
  • Si(111)
  • Surface structure
  • Trimers of Bi atom

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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