TY - GEN
T1 - Structure of disordered materials studied by high-energy x-ray diffraction technique
AU - Kohara, S.
AU - Ohara, K.
AU - Temleitner, L.
AU - Ohishi, Y.
AU - Fujiwara, A.
AU - Takata, M.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2012
Y1 - 2012
N2 - With the arrival of the third generation of synchrotron sources and/or the introduction of advanced insertion devices (wigglers and undulators), the high energy (E > 50 keV) x-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials than was hither to available. Since we built the SPring-8 bending magnet beamline BL04B2 and two-axis diffractometer for disordered materials in 1999, we have studied on disordered materials from ambient to extreme condition. In this article, the high-energy x-ray diffraction beamline BL04B2 of SPring-8 and recent developments of ancillary equipment (automatic sample changer, conventional high-temperature furnace, aerodynamic levitation furnace) are introduced. Furthermore the structural analysis on the basis of diffraction data with the aid of computer simulations, which we performed in the last 10 years is reviewed.
AB - With the arrival of the third generation of synchrotron sources and/or the introduction of advanced insertion devices (wigglers and undulators), the high energy (E > 50 keV) x-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials than was hither to available. Since we built the SPring-8 bending magnet beamline BL04B2 and two-axis diffractometer for disordered materials in 1999, we have studied on disordered materials from ambient to extreme condition. In this article, the high-energy x-ray diffraction beamline BL04B2 of SPring-8 and recent developments of ancillary equipment (automatic sample changer, conventional high-temperature furnace, aerodynamic levitation furnace) are introduced. Furthermore the structural analysis on the basis of diffraction data with the aid of computer simulations, which we performed in the last 10 years is reviewed.
KW - Disordered materials
KW - High-energy x-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=84856187749&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84856187749&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.706-709.1690
DO - 10.4028/www.scientific.net/MSF.706-709.1690
M3 - Conference contribution
AN - SCOPUS:84856187749
SN - 9783037853030
T3 - Materials Science Forum
SP - 1690
EP - 1695
BT - THERMEC 2011
PB - Trans Tech Publications Ltd
T2 - 7th International Conference on Processing and Manufacturing of Advanced Materials, THERMEC'2011
Y2 - 1 August 2011 through 5 August 2011
ER -