Structure determination of thin CoFe films by anomalous x-ray diffraction

Andrei Gloskovskii, Gregory Stryganyuk, Siham Ouardi, Gerhard H. Fecher, Claudia Felser, Jaroslav Hamrle, Jaromír Pištora, Subrojati Bosu, Kesami Saito, Yuya Sakuraba, Koki Takanashi

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

This work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure.

Original languageEnglish
Article number074903
JournalJournal of Applied Physics
Volume112
Issue number7
DOIs
Publication statusPublished - 2012 Oct 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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