Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

Koichi Tamura, Yuki Kimura, Hitoshi Suzuki, Osamu Kido, Takeshi Sato, Toshiaki Tanigaki, Mami Kurumada, Yoshio Saito, Chihiro Kaito

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Ultrafine particles of various metals [Cr, Mn, Fe, Al, Ni, Cu, In, Si, Ge, Zn, Mg and Sn], produced by the gas evaporation method were covered with the oxide layer of thickness less than 10 nm by exposure to air. In order to clarify the structure and thickness of the surface oxide layer on various metal ultrafine particles, high-resolution electron microscopy and infrared spectroscopy have been extensively used.

Original languageEnglish
Pages (from-to)7489-7492
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume42
Issue number12
DOIs
Publication statusPublished - 2003 Dec

Keywords

  • HRTEM
  • IR spectra
  • Natural oxide
  • Thickness
  • Ultrafine particles

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Structure and Thickness of Natural Oxide Layer on Ultrafine Particle'. Together they form a unique fingerprint.

  • Cite this

    Tamura, K., Kimura, Y., Suzuki, H., Kido, O., Sato, T., Tanigaki, T., Kurumada, M., Saito, Y., & Kaito, C. (2003). Structure and Thickness of Natural Oxide Layer on Ultrafine Particle. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42(12), 7489-7492. https://doi.org/10.1143/jjap.42.7489