Structure and thermoelectric properties of PbTe films deposited by thermal evaporation method

M. P. Nguyen, J. Froemel, S. Hatayama, Y. Sutou, J. Koike, S. Tanaka, M. Esashi, T. Gessner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Lead telluride (PbTe) thin films have been deposited on SiO2substrate using thermal evaporation method. The structure of the films was found to have a face-centered cubic (fcc) with predominant grain growth in the (200) direction for both as-deposited and annealed samples up to 350 oC in vacuum for 1 h. The in-plain electrical resistivity and Hall measurements via van der Pauw method as a function of annealed temperatures were measured. It was found that increasing the annealing temperature led to increase in grain size, which in turn caused decrease of electrical resistivity and increase of Seebeck coefficient. The high power factor of 141.0 ìWm-1K-2was obtained for the annealed samples at 350 oC in vacuum for 1 h.

Original languageEnglish
Title of host publication16th International Conference on Nanotechnology - IEEE NANO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages566-568
Number of pages3
ISBN (Electronic)9781509039142
DOIs
Publication statusPublished - 2016 Nov 21
Event16th IEEE International Conference on Nanotechnology - IEEE NANO 2016 - Sendai, Japan
Duration: 2016 Aug 222016 Aug 25

Publication series

Name16th International Conference on Nanotechnology - IEEE NANO 2016

Other

Other16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
CountryJapan
CitySendai
Period16/8/2216/8/25

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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    Nguyen, M. P., Froemel, J., Hatayama, S., Sutou, Y., Koike, J., Tanaka, S., Esashi, M., & Gessner, T. (2016). Structure and thermoelectric properties of PbTe films deposited by thermal evaporation method. In 16th International Conference on Nanotechnology - IEEE NANO 2016 (pp. 566-568). [7751384] (16th International Conference on Nanotechnology - IEEE NANO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2016.7751384