TY - JOUR
T1 - Structure analysis of high-tcsuperconductor bi-ca-sr-cu-o by processing of high-resolution electron microscope images
AU - Shindo, Daisuke
AU - Hiraga, Kenji
AU - Hirabayashi, Makoto
AU - Kikuchi, Masae
AU - Syono, Yasuhiko
PY - 1988/6
Y1 - 1988/6
N2 - A modulated structure in Bi-Ca-Sr-Cu-O was analyzed by image processing of high-resolution electron micrographs. The contrast of the modulated structure along the [010] direction with about 5a period was strongly enhanced by the processing. The structural modulation, mainly caused by the displacements of Bi atoms due to oxygen vacancies in the Bi4>Ti3>O12>derivative structure was clearly revealed. By combining the above result with processed images in other orientations, a realistic model of the modulated structure is proposed. It is demonstrated that the processing of high resolution images is useful in analyzing the complicated modulated structures such as observed in the new high-Tc>superconductor Bi-Ca-Sr-Cu-O.
AB - A modulated structure in Bi-Ca-Sr-Cu-O was analyzed by image processing of high-resolution electron micrographs. The contrast of the modulated structure along the [010] direction with about 5a period was strongly enhanced by the processing. The structural modulation, mainly caused by the displacements of Bi atoms due to oxygen vacancies in the Bi4>Ti3>O12>derivative structure was clearly revealed. By combining the above result with processed images in other orientations, a realistic model of the modulated structure is proposed. It is demonstrated that the processing of high resolution images is useful in analyzing the complicated modulated structures such as observed in the new high-Tc>superconductor Bi-Ca-Sr-Cu-O.
KW - Bi-Ca-Sr-Cu-O
KW - High-Tc superconductor
KW - High-resolution electron microscopy
KW - Image processing
KW - Incommensurate structure
KW - Oxygen vacancy
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U2 - 10.1143/JJAP.27.L1018
DO - 10.1143/JJAP.27.L1018
M3 - Article
AN - SCOPUS:0024018852
VL - 27
SP - L1018-L1021
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 6A
ER -