Structural study of amorphous zinc-ferrite film by the anomalous x-ray scattering method

Y. Waseda, E. Matsubara, K. Okuda, K. Omote, K. Tohji, S. N. Okuno, K. Inomata

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

The anomalous X-ray scattering (AXS) method using Zn and Fe K-absorption edges has been applied to a structural study of amorphous zinc-ferrite film (1.4 mu m in thickness) grown on a silicate glass substrate. The possible atomic arrangements in near-neighbour regions of amorphous zinc-ferrite films were estimated by reproducing the differential intensity profiles for Zn and Fe as well as the ordinary diffraction profile using the least-squares technique for the interference function. It is then suggested that Zn and Fe atoms are likely to occupy both tetrahedral and octahedral sites formed by oxygens. This result has also been confirmed by the EXAFS analysis using the in-house EXAFS facility.

Original languageEnglish
Article number002
Pages (from-to)6355-6366
Number of pages12
JournalJournal of Physics: Condensed Matter
Volume4
Issue number30
DOIs
Publication statusPublished - 1992 Dec 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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